Using scanning electron microscopy to identify starch in sorghum grains resistant to maize weevil, <em>Sitophilus zeamais</em>

Wednesday, December 16, 2009

Hall D, First Floor (Convention Center)

Michael W. Pendleton , Microscopy and Imaging Center Mail Stop 2257, Texas A&M University, College Station, TX

E. Ann Ellis , Microscopy and Imaging Center Mail Stop 2257, Texas A&M University, College Station, TX

Bonnie Pendleton , Agricultural Sciences, West Texas A&M University, Canyon, TX

doi: 10.1603/ICE.2016.42202

D0502 Using scanning electron microscopy to identify starch in sorghum grains resistant to maize weevil, Sitophilus zeamais