Variable-pressure scanning electron microscopy images of sorghum predict resistance to storage insect pests

Tuesday, November 17, 2015
Exhibit Hall BC (Convention Center)
Bonnie Pendleton , Agricultural Sciences, West Texas A&M University, Canyon, TX
Gary Peterson , Agronomy, Texas A&M, Lubbock, TX
See more of: P-IE Section Poster Session A
See more of: Poster