Use of scanning electron microscopy and energy dispersive spectroscopy to correlate the arrangement of starch in sorghum grain with resistance to maize weevil (Coleoptera: Curculionidae)

Tuesday, December 14, 2010

Grand Exhibit Hall (Town and Country Hotel and Convention Center)

Bonnie Pendleton , Agricultural Sciences, West Texas A&M University, Canyon, TX

Michael W. Pendleton , Microscopy and Imaging Center Mail Stop 2257, Texas A&M University, College Station, TX

E. Ann Ellis , Microscopy and Imaging Center Mail Stop 2257, Texas A&M University, College Station, TX

Gary C. Peterson , Texas AgriLife Research, Texas A&M University, Lubbock, TX

Fernando M. Chitio , Nampula Research Center, IIAM, Nampula, Mozambique

Suhas Vyavhare , Department of Entomology, Texas A&M University, College Station, TX

doi: 10.1603/ICE.2016.52382

D0431 Use of scanning electron microscopy and energy dispersive spectroscopy to correlate the arrangement of starch in sorghum grain with resistance to maize weevil (Coleoptera: Curculionidae)