Tuesday, 19 November 2002
D0464

This presentation is part of : Display Presentations, Section F. Crop Protection Entomology

Negative cross-resistance factors: Critical parameters in their development and deployment

Barry R. Pittendrigh1, Michael E. Scharf1, and Patrick Gaffney2. (1) Purdue University, Department of Entomology, 1158 Smith Hall, West Lafayette, IN, (2) Department of Statistics, University of Wisconsin-Madison, 1210 West Dayton Street, Madison, WI

Negative cross-resistance (NCR) occurs when a mutant allele confers (i) resistance to one toxic chemical and (ii) hyper-susceptibility to another. Using Monte Carlo simulations, we investigated the concurrent use of a pair of NCR toxins to control a hypothetical insect pest population. When the toxins killed more heterozygotes than homozygotes, the resistance allele became either extremely common or rare depending on starting allelic frequency. If the NCR toxins did not kill the two homozygous groups equally, then the toxin with lesser toxicity eventually played a greater role in the control of the pest population. Based on our results, we present an approach for the systematic development of an NCR toxin after the commercial release of the first toxin. First, large-scale screens are performed to find chemicals that kill the resistant homozygous insects, but not the susceptible ones. Chemicals that preferentially kill resistant insects are then tested for toxicity to the heterozygotes. Those highly toxic to both homo-and heterozygotes are given the highest priority for development.

Keywords: pesticide, resistance

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