Use of reflectance data to identify and detect stress of insects

Sunday, November 10, 2013: 1:27 PM
Meeting Room 19 B (Austin Convention Center)
Christian Nansen , The University of Western Australia, Perth, Australia
José R. P. Parra , Department of Entomology and Acarology, Escola Superior de Agricultura Luiz de Queiroz (ESALQ), Universidade de São Paulo (USP), Piracicaba, SP, Brazil
Aloisio Coelho , Department of Entomology and Acarology, University of São Paulo, Piracicaba, Brazil
We describe how reflectance data acquired in 160 spectral bands from 405-907 nm and a spatial resolution of about 45 pixels per mm2 could be used to identify parasitized host eggs and adult specimens of three species of Trichogramma: T. galloi, T. pretiosum and T. atopovirilia. We also analyze reflectance data acquired from larger black flour beetles (Cynaeus angustus) over time and with/without exposure to entompathogenic nematodes. We use these data sets to highlight some of the possibilities associated with use of imaging technology and advanced reflectance data analysis as part of both insect identification and characterisation of insect responses to mortality factors.