The 2005 ESA Annual Meeting and Exhibition
December 15-18, 2005
Ft. Lauderdale, FL
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Saturday, December 17, 2005 D0460
Mapping European corn borer damage using yield monitor data in Bt/nonBt strip-planted corn
Thomas W. Sappington, tsapping@iastate.edu, USDA-ARS, Corn Insects & Crop Genetics Research Unit, Genetics Laboratory, Iowa State University, Ames, IA