The 2005 ESA Annual Meeting and Exhibition
December 15-18, 2005
Ft. Lauderdale, FL

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Friday, December 16, 2005
D0160

Factors affecting the life history characteristics of univoltine and multivoltine European corn borer including the role of heritability

Faruque Zaman, mfz108@psu.edu1, Edwin Rajotte, egrajotte@psu.edu1, Dennis D. Calvin, ifa@psu.edu1, Liwang Cui, luc2@psu.edu1, and Douglas Sumerford, sumrford@iastate.edu2. (1) Pennsylvania State University, Entomology, 527 ASI building, State College, PA, (2) USDA-ARS, Corn Insects & Crop Genetics Research Unit, Genetics Laboratory, Iowa State University, Ames, IA

Post-diapause and non-diapause development of European corn borer were studied for multiple years. Life history differences in univoltine and multivoltine ECB populations are primarily due to post-diapause and non-diapause developmental rates. Parasitoides infestation rate are much higher in overwintering multivoltine population then univoltine population. Pupal weight was higher for overwintering univoltine relative to multivoltine individuals. The non-diapause developmental rate of offspring is related to the parent’s post-diapause development requirement and is a highly heritable trait.


Species 1: Lepidoptera Crambidae Ostrinia nubilalis (European corn borer)
Species 3:
Keywords: Degree day, Heritability

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