Previous research showed that LAI, leaf area index, was strongly related to yield of double-cropped soybean. Knowing LAI, and therefore yield potential, is valuable information for growers to improve pest management decision making. However, the equipment for estimating LAI is expensive and tedious to use. The research reported here was an initial effort to determine if remote sensing technologies can be used to estimate LAI. A series of small plots was established to create different canopy levels using different soybean cultivars and planting dates. Infrared images were taken of plots from fixed-wing aircraft at three different altitudes (range: 365.76-975.36 meters). NDVI values were calculated from infrared images. On each imaging date, LAI values were taken in each plot using the LAI-2000 Plant Canopy Analyzer. LAI values were related to NDVI using statistical regression procedures. Results indicated a strong relationship with NDVI increasing as LAI increased, with R-square values ranging from 0.7686-0.8964, regardless of altitude.
Keywords: NDVI, Leaf area index
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