Tuesday, December 11, 2001 - 8:36 AM
0564
Linear plateau models to describe the relationship between soybean LAI and yield
David Ames Herbert Jr, Sean Malone, and David L. Holshouser. Virginia Tech, Department of Entomology, Tidewater Agric. Res. & Ext. Ctr, 6321 Holland Road, Suffolk, VA
Keywords: leaf area index, defoliation
The ESA 2001 Annual Meeting - 2001: An Entomological Odyssey of ESA